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Wafer Tester, Monitoring Defects and Contamination in the Bulk Region of Si Wafer
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Product: Views:51Wafer Tester, Monitoring Defects and Contamination in the Bulk Region of Si Wafer 
Unit price: Negotiable
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Delivery date: Since the payment date Days delivery
Valid until: Long-term effective
Last updated: 2017-08-08 03:34
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Model Number: KP - A65 Key Specifications/Special Features: Special features:Monitoring defects and contamination in the bulk region of Si waferKey specifications:Impurities due to heavy metal contaminationCan detect Co, Ni, Ti, Mo, W, Pt, Au and PdCan detect but not identify them uniquelyCan detect and identify Cu and CrIron concentration determination both in CZ and FZ wafers
  • Requires surface passivation: thermal oxide, chemical passivation or corona charging
  • Can be combined with the SPV, VQ and JPV
  • Integrated FOUP and mini environment
  • Main Export Markets:
    • Asia
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